Exciton transport and nonradiative decay in semiconductor nanostructures

Exciton transport and nonradiative decay in semiconductor nanostructures
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半导体纳米结构中的激子输运和非辐射衰变

DOI:
10.1103/physrevb.58.10687
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发表时间:
1998
期刊:
影响因子:
--
通讯作者:
D. J. Wolford
D. J. Wolford
中科院分区:
--
文献类型:
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作者:
I. Krivorotov;T. Chang;G. D. Gilliland;L. P. Fu;K. Bajaj;D. J. Wolford

文献摘要

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A phenomenological theory describing the exciton photoluminescence ~PL! kinetics in type-II superlattices is proposed herein, which takes into account both the intrinsic exciton radiative decay and nonradiative decay due to exciton trapping by interfacial defects surrounding a ‘‘disordered’’ interface. We have thus investigated the effect of system dimensionality on details of these nonradiative-decay kinetics. For effectively threedimensional and two-dimensional structures, the theory predicts a transition from strongly nonexponential to nearly exponential decay kinetics as the temperature is increased. Contrastingly, for one-dimensional structures the decay kinetics is predicted to be nonexponential at all temperatures. Using these predictions, we have applied this model to explain our observed time-resolved PL on specific short-period type-II GaAs/AlAs superlattices. These PL decays are thus explained both over a wide range of temperatures ~2‐30 K! and over an observed crossover from nonexponential to exponential behavior. The model allows us to extract a nonradiative-defect density and an average radiative-decay rate from the experimental data. @S0163-1829~98!03940-X#