Investigation on the directional dark-field signals from paperboards using a grating interferometer
Investigation on the directional dark-field signals from paperboards using a grating interferometer
复制标题
使用光栅干涉仪研究纸板的定向暗场信号
DOI：
--
复制
发表时间：
2014
期刊：
影响因子：
--
通讯作者：
B. Norlin
中科院分区：
文献类型：
--
作者：
S. Reza;G. Pelzer;T. Weber;C. Fröjdh;F. Bayer;G. Anton;J. Rieger;J. Thim;T. Michel;B. Norlin
基于光栅干涉仪的相位衬度X射线成像（PCXI）技术的最新进展使得使用传统的X射线管能够获得高质量的暗场图像。暗场图像映射了物体内部的散射不均匀性。由于暗场图像是通过只考虑那些在穿过物体时散射的光子来构建的，因此它可以揭示关于物体内部结构的有用信息，例如纸板内部的纤维结构。纸板的最终使用性能，例如印刷质量和挺度，取决于纸板涂层的厚度和结构的均匀性。涂层的均匀性由涂覆技术、涂覆材料和基片的形貌决定。本文对四种不同质量指标的纸板样品的暗场信号进行了分析。计算了所有样品的各向同性和各向异性散射系数。根据各向同性系数与纸板质量指标之间的相关性，提出了一种新的纸板质量检测方法。
Recent advancements in the grating interferometer based Phase Contrast X-ray Imaging (PCXI) technique enables high quality dark-field images to be obtained using conventional X-ray tubes. The dark-field images map the scattering inhomogeneities inside objects. Since, the dark-field image is constructed by considering only those photons which are scattered while passing through the objects, it can reveal useful information about the object inner structures, such as, the fibre structures inside paperboards. The end-use performance of paperboards, such as the printing quality and the stiffness depends on the uniformity in the thickness and the structures of the coating layer of the paperboards. The uniformity in the coating layer is determined by the coating techniques, the coating materials and the topography of the base sheet. In this article, the dark-field signals from four paperboard samples with different quality indices are analysed. The isotropic and the anisotropic scattering coefficients for all of the samples have been calculated. Based on the correlation between the isotropic coefficients and the quality indices of the paperboards, a new method for paperboard quality measurement has been suggested.