An analytical thermal resistance model for calculating mean die temperature of a typical BGA packaging

An analytical thermal resistance model for calculating mean die temperature of a typical BGA packaging
复制标题

DOI:
10.1016/j.tca.2010.10.009
复制
发表时间:
2011-01
期刊:
影响因子:
3.5
通讯作者:
Xiaobing Luo;Zhangming Mao;Jv Liu;Sheng Liu
Xiaobing Luo;Zhangming Mao;Jv Liu;Sheng Liu
中科院分区:
化学3区
文献类型:
--
作者:
Xiaobing Luo;Zhangming Mao;Jv Liu;Sheng Liu

文献摘要

被引文献

相似文献