Adaptive Fault Diagnosis of Analog Circuits by Operation-Region Model and X–Y Zoning Method
Adaptive Fault Diagnosis of Analog Circuits by Operation-Region Model and X–Y Zoning Method
复制标题
基于工作区域模型和X-Y分区法的模拟电路自适应故障诊断
DOI：
10.1007/s10836-007-5022-6
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发表时间：
2004
期刊：
影响因子：
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通讯作者：
J. Kato
中科院分区：
文献类型：
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作者：
Y. Miura;J. Kato
提出了一种结合操作区模型和X-Y分区法实现的模拟电路故障诊断方法。在该方法中，我们可以实现基于数字电路诊断方法的诊断过程，因为我们开发了一种数据处理方法来离散地处理数据。在本文中，我们通过使用自适应测试来改进该方法，以获得更短的诊断序列长度，并显示其特征。此外，我们提出了一种新的数据处理方法，该方法利用电路的输出响应来获得更好的诊断性能。通过对ITC‘97标准电路硬故障和软故障的测试，验证了所提方法的有效性。这些改进的方法可以在不降低诊断分辨率和CPU时间的情况下缩短诊断序列的长度。
We have proposed a method for diagnosing analog circuits that is realized by combining the operation-region model and theX–Yzoning method. In the method, we could implement a diagnosis procedure based on a diagnostic method for digital circuits because we developed a data processing method to handle data discretely. In this paper, we improve the method by using an adaptive test to obtain a shorter diagnostic sequence length and show its characteristics. Moreover, we propose a new data processing method that utilizes the output response of a circuit to obtain better diagnostic performance. We demonstrate the effectiveness of the proposed methods by applying them to ITC’97 benchmark circuits with hard faults and soft faults. These improved methods can reduce the diagnostic sequence length without degrading the performance of diagnostic resolution and CPU time.