Study of radiation damage in InGaN and AlGaN films induced by 8.9 MeV Bi33+ ions
Study of radiation damage in InGaN and AlGaN films induced by 8.9 MeV Bi33+ ions
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DOI:
10.1016/j.nimb.2013.04.042
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发表时间:
2013-06
影响因子:
1.3
通讯作者:
Lijun Zhang;C. -. Li;Jiangtao Zhao;K. J. Yang;Guixu Zhang;T. S. Wang;C. Zhang
中科院分区:
文献类型:
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作者:
Lijun Zhang;C. -. Li;Jiangtao Zhao;K. J. Yang;Guixu Zhang;T. S. Wang;C. Zhang