An effective functional safety solution for automotive systems-on-chip

An effective functional safety solution for automotive systems-on-chip
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适用于汽车片上系统的有效功能安全解决方案

DOI:
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发表时间:
2017
期刊:
International Test Conference
影响因子:
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通讯作者:
Y. Zorian
Y. Zorian
中科院分区:
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文献类型:
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作者:
Grigor Tshagharyan;Gurgen Harutunyan;Y. Zorian

文献摘要

被引文献

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提出了一种基于汽车 SoC 多用途内置自测试和修复基础设施的功能安全解决方案。该解决方案允许构建分层​​网络并以多种现场测试和维修模式对其进行管理。
A functional safety solution based on multi-purpose built-in self-test and repair infrastructure for automotive SoCs is presented. This solution allows building a hierarchical network and managing it in multiple in-field test and repair modes.