Reliability assessment of metallized film capacitors using degradation failure model
Reliability assessment of metallized film capacitors using degradation failure model
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发表时间：
2005
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通讯作者：
Zhao Jian-yin
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作者：
Zhao Jian-yin
金属化薄膜脉冲电容器是惯性约束激光聚变装置的关键部件。对于高可靠性的电容器，用传统的失效时间分析方法很难对其进行可靠性评估。通过对金属化薄膜电容器退化机理的分析，提出了一种退化失效模型，该模型中的参数可以通过电容器的性能退化测量来估计。该模型中未知参数的估计值分别为0.000 119 4和0.006 7。该退化失效模型可以表示失效概率密度函数(PDF)和累积分布函数(CDF)。基于这些估计值和PDF/CDF，得到了金属化薄膜电容器的可靠性模型。根据可靠性模型，电容器存活10000次的概率为0.988 5，预计寿命为23461次。
The metallized film pulse capacitor is a key component of the inertial confinement laser fusion facility. For the high reliability capacitors, it is difficult to assess the reliability by using the traditional time-to-failure analysis method. By analyzing degradation mechanism of the metallized film capacitor, this paper presents a degradation failure model in which parameters can be estimated from the performance degradation measures of the capacitor. The estimation values of the unknown parameters in this model are 0.000 119 4 and 0.006 7, respectively. Both the failure probability density function (PDF) and the cumulative distribution function (CDF) can be presented by this degradation failure model. Based on these estimation values and the PDF/CDF, the reliability model of the metallized film capacitors is obtained. According to the reliability model, the probability of the capacitors to survive 10 000 shot is 0.988 5, the predicted lifetime of the capacitors is 23 461(shot).