Highly sensitive birefringence measurement in THz frequency region and its application to stress measurement
Highly sensitive birefringence measurement in THz frequency region and its application to stress measurement
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DOI：
10.1109/icimw.2007.4516673
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发表时间：
2007-09
期刊：
影响因子：
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通讯作者：
S. Ebara;Y. Hirota;M. Tani;M. Hangyo
中科院分区：
文献类型：
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作者：
S. Ebara;Y. Hirota;M. Tani;M. Hangyo
我们已经构建了一个太赫兹时域光谱（THz-TDS）系统，它能够检测到小到Deltan ~ 5倍10-4的双折射。该偏振敏感测量系统可用于检测聚合物、纸张、纺织品等各种纤维材料的结构取向，也可用于聚合物的应力双折射测量，获得太赫兹区的应力光学系数。太赫兹辐射的应力双折射测量是有用的光学不透明的材料，普通的光弹性应力测量是不可能的。
We have constructed a terahertz time-domain spectroscopy (THz-TDS) system which is able to detect a birefringence as small as Deltan ~ 5 times 10-4. This polarization sensitive measurement system is applied to detect the structural orientation of various fibrous materials such as polymers, papers, textiles, etc. It is also applied to the stress induced birefringence measurements for polymers, from which the stress-optic coefficients in THz region are obtained. The stress birefringence measurement with THz radiation is useful for optically opaque materials for which the ordinary photoelastic stress measurement is not possible.