Tunable Microstructures in Entropy-Stabilized Oxide Thin Films Studied with Unsupervised Machine Learning Assisted Electron Microscopy
Tunable Microstructures in Entropy-Stabilized Oxide Thin Films Studied with Unsupervised Machine Learning Assisted Electron Microscopy
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DOI:
10.1017/s1431927622009862
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发表时间:
2022-07
影响因子:
2.8
通讯作者:
L. Miao;George N. Kotsonis;J. Maria;N. Alem
中科院分区:
文献类型:
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作者:
L. Miao;George N. Kotsonis;J. Maria;N. Alem
A steady stream of new and advanced materials is crucial for scientific discovery and technology opportunities. High-entropy materials have become a rich new source of crystalline materials at the frontier of materials discovery. High entropy (HE) materials leverage increased configurational entropy to lower the overall free energy, stabilizing multiple atomic species into a single lattice.[1] HE materials have demonstrated promising functional properties for electrochemical[2], thermoelectric[3], catalytic[4], and many more applications. Entropy stabilization was first realized in high entropy alloys (HEAs). This concept was only recently expanded into the non-metallic crystals with the synthesis of the rocksalt structure high entropy oxides (R-HEOs) in 2015.[1,5] HEOs show inherent metastability at room temperature. Our previous studies on the HEO thin film synthesized with pulsed laser deposition (PLD) method demonstrated the metastability of the crystal at room temperature can be exploited for tuning the cation oxidation states with growth temperature.[6,7] In this study, we further investigated the correlation between microstructure and the synthesis conditions in PLD grown R-HEO thin film with the composition (Co 0.2 Cu 0.2 Mg 0.2 Ni 0.2 Zn 0.2 )O with advanced transmission electron microscopy (TEM) assisted by unsupervised machine learning. In particular, we focused on the impact of the growth rate and the film thickness on the microstructures. The samples for the study consisted of four epitaxial HEO thin films deposited at 400°C, with the laser pulse rate and the total thickness of 1) 5Hz & 80 nm, 2) 5Hz and 400 nm, 3)