A simple approach for characterizing the spatially varying sensitivity of microchannel plate detectors
A simple approach for characterizing the spatially varying sensitivity of microchannel plate detectors
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DOI：
10.1063/5.0092346
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发表时间：
2022-07-01
影响因子：
1.6
通讯作者：
Nomerotski, Andrei
中科院分区：
文献类型：
--
作者：
Aglagul, Denis;Kaufman, Brian;Nomerotski, Andrei
我们提出了一种简单的方法来表征耦合到荧光粉探测器的微通道板(MCP)中的增益的空间变化。该技术实现简单，通用性强，可推广到其他类型的探测器。我们在实验室和蒙特卡罗生成的数据集上演示了该方法的有效性。此外，我们使用该方法来测量MCP暴露在越来越多的电子中时增益随时间的变化。
We present a simple approach to characterize the spatial variation of the gain in microchannel plate (MCP) coupled to phosphor detectors using single electron or photon hits. The technique is easy to implement and general enough to be extended to other kinds of detectors. We demonstrate the efficacy of the approach on both laboratory and Monte Carlo generated datasets. Furthermore, we use the approach to measure the variation in gain over time as the MCP is exposed to an increasing number of electrons.