Structure and dielectric properties of LaxHf(1−x)Oy thin films: The dependence of components
Structure and dielectric properties of LaxHf(1−x)Oy thin films: The dependence of components
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DOI：
10.1016/j.materresbull.2013.03.031
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发表时间：
2013-07
影响因子：
5.4
通讯作者：
Z. Qi;Xuerui Cheng;Guobin Zhang;Ting Li;Yuyin Wang;T. Shao;Cheng-xiang Li;B. He
中科院分区：
文献类型：
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作者：
Z. Qi;Xuerui Cheng;Guobin Zhang;Ting Li;Yuyin Wang;T. Shao;Cheng-xiang Li;B. He
LaxHf(1−x)Oy(x=0, 0.1, 0.3, 0.5, 0.7, y=2−(1/2)x) thin films were grown by pulsed laser deposition (PLD) method. The component dependence of the structure and vibration properties of these thin films is studied by combining X-ray diffraction, X-ray absorption fine structure (XAFS) and infrared spectroscopy. The thin film with 10% La/(La+Hf) atom ratio forms a cubic HfO2phase and it has the largest static dielectric constant. More La atoms introduced cause amorphous phase formed and the static dielectric constants increase with the La content. Although XAFS indicates that these amorphous thin films have almost same local structures, the infrared phonon modes with most contribution to the static dielectric constant move to lower frequency, which results in the component dependence of the dielectric constant.
