Y-Ba-Cu-O thin films on 3" sapphire wafers for microwave devices
Y-Ba-Cu-O thin films on 3" sapphire wafers for microwave devices
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用于微波器件的 3" 蓝宝石晶圆上的 Y-Ba-Cu-O 薄膜
DOI:
10.1109/77.919356
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发表时间:
2001
期刊:
影响因子:
--
通讯作者:
R. Schwab
中科院分区:
文献类型:
--
作者:
R. Aidam;J. Geerk;G. Linker;F. Ratzel;J. Reiner;R. Schneider;R. Smithey;A. Zaitsev;E. Gaganidze;R. Schwab
Epitaxially grown large area YBCO films are essential for superconducting high frequency devices, e.g. microstrip filters for telecommunications. Therefore, c-axis oriented, 250 to 500 nm thick YBCO films were simultaneously deposited by sputtering from hollow cylindrical targets on both sides of CeO/sub 2/ buffered 3" sapphire wafers. The lateral homogeneity was analyzed by mapping the surface resistance, R/sub s/, at 145 GHz and 75 K. Values of R/sub s/ below 50 m/spl Omega/ were reached over the whole area. The HF power handling capability was demonstrated by a break down field higher than 10 mT at 8.5 GHz and 77 K. In order to demonstrate the quality of our sputtered films with respect to large area high frequency applications, simple microstrip resonators were patterned by UV photo lithography and wet chemical etching. At a circulating power of up to 1 W, very high unloaded quality factors, Q/sub 0/, of up to 32000 at 4 GHz and 77 K were achieved. Above 5 W, Q/sub 0/ decreased due to the field dependence of R/sub s/. The operation of complex structures was demonstrated by 3 pole and 7 pole bandpass filters operated at 77 K and 2 GHz and 6 GHz, respectively. The filters, tuned by brass tuning elements, showed transmission losses of less than -0.3 dB and reflection losses of more than -17 dB.