Surface-induced dissociation by Fourier transform mass spectrometry.
Surface-induced dissociation by Fourier transform mass spectrometry.
复制标题
通过傅里叶变换质谱法进行表面诱导解离。
DOI:
10.1021/ac00212a017
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发表时间:
1990
影响因子:
7.4
通讯作者:
Wilkins,CL
中科院分区:
文献类型:
--
作者:
Ijames,CF;Wilkins,CL
A recent and very promising addition to the list of ion fragmentation techniques is surface-induceddissociation (SID), introduced by Cooks and co-workers in 1985 (1). The technique consists of accelerating parent ions into a metal target and then mass analyzing the inelastically scattered daughter ions. In a series of papers, these workers have de-scribed implementationof SID using hybrid magnetic sec-tor-quadrupole (1), tandem quadrupole (2), andtandem time-of-flight mass spectrometers (3). These instruments provide collision energies up to 300 eV for electronionization-generated parent ions and up to unit daughter ion mass resolution. Conversion efficiencies, defined as the sum of daughter ion abundances divided by the parent ion abundance in the absence of SID, range from 2% to 15%. It should be noted that this common definition for multiple analyzer instruments exagerates the SID efficiency because it neglects substantial losses of parent ions in the second and subsequent analyzers. The stricter definition, which would use the parent ion abundance arriving at the SID site, gives less than 1% SID efficiency. Here, surface-induced dissociation with comparable efficiency using a Fourier transform mass spectrometer (FTMS), where there is no such distinction, is described. From an analytical standpoint, a major advantage of SID is its ability to convert a relatively high percentage of translational energy into internal energy. For example, 25 eV SID of iron pen-tacarbonyl ions yields an average internal energy of approx-imately 4 eV while collisions at the same laboratory energy with argon gas deposit less than 2 eV, on average (4). The average internal energy increases with translational energy, reaching 8 eV at a collision energy of 140 eV. This corresponds approximately to the energy deposited by a 7-keV collision with an argon atom (4). It should also be noted that similar high efficiencies can be obtained under higher pressure, multiple collision conditions (eg collision induced dissociation (CID) using a triple quadrupole or ion trap mass spectrometer).A major limitation of conventional collisional activation tandem mass spectrometry (MS/MS) is that the yieldof secondary ions decreases as the parent mass increases (5). This is a result of the increasing mismatch in parent and target masses and the greater numberof vibrational modes available in the larger molecules, facilitating internal distribution of the deposited energy, rather than dissociation. SID has the potential to increase internal energy deposition and thus to increase the efficiency of MS/MS of high mass ions. Evidence for this is found in Aberth’s recent report of SID of parent ions produced by secondary ion mass spectrometry using a tandem Wien filter instrument (6). A microchannel plate in a grazing incidence configuration was employed as the target and collision energies extended up to 1000 eV. Both positive and negative spectra of leucine-enkephalin (molecular weight 555) were reported, with fragmentation similar to that pro-duced by high-energy CID. Also,(CsI^ Cs* was fragmented to yield (CsI)„Cs+ ions from= 0 to 23. These results show that SID is feasible with high mass ions at collision energies as low as 1 keV.