The Effect of Probe Input Capacitance On Measurement Accuracy
The Effect of Probe Input Capacitance On Measurement Accuracy
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探头输入电容对测量精度的影响
DOI：
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发表时间：
1998
期刊：
影响因子：
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通讯作者：
Se
中科院分区：
文献类型：
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作者：
Song;H. Chu;N. Rajalingam;Hyobeen Chae;Jaehyun Yoon;Injun Hwang;Se
选择具有合适电容的探头将显着提高测量精度。大多数数字和模拟设计人员都认为，选择探头时越来越重要的考虑因素是电容。探头或夹具的电容会增加被测设备 (DUT) 的负载，并可能导致上升时间缩短或引起畸变，例如采集信号中的振铃。在出于电路负载考虑而需要高阻抗探测的情况下，探头电容尤其重要。探头电容不仅会给电路带来负载，而且还增加了仔细接地的需要。
Selecting a probe with the right capacitance will significantly improve measurement accuracies. Most digital and analog designers agree that an increasingly important consideration in selecting a probe is capacitance. The capacitance of the probe or fixture adds to the load of the device-under-test (DUT) and can cause the risetime to be degraded or induce aberrations such as ringing in the acquired signal. In cases where high-impedance probing is required due to circuit loading considerations, probe capacitance is especially important. Probe capacitance not only loads the circuit, but it increases the need for careful grounding.