Measurements of millimeter-wave surface resistance and temperature dependence of reactance of thin HTS films using quasi-optical dielectric resonator
Measurements of millimeter-wave surface resistance and temperature dependence of reactance of thin HTS films using quasi-optical dielectric resonator
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DOI：
10.1109/tasc.2005.848634
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发表时间：
2005-06
影响因子：
1.8
通讯作者：
N. Cherpak;A. Barannik;S. Bunyaev;Y. Prokopenko;S. Vitusevich
中科院分区：
文献类型：
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作者：
N. Cherpak;A. Barannik;S. Bunyaev;Y. Prokopenko;S. Vitusevich
作者之前提出的用于精确测量大面积高温超导薄膜表面电阻（R/sub s/）的技术得到了进一步发展。它基于准光介电谐振器（QDR）的应用。给出了通过使用“循环”程序在 77 K 下获得的各个 Y-123 薄膜的 R/sub s/ 数据。主要关注开发薄膜表面电抗变化的温度依赖性测量技术（/spl Delta/X/sub s/）。通过拟合程序对实验获得的相关性进行分析，从而可以确定场穿透深度与温度相关性的理论模型的有效性。特别是，在 T/sub c/ 附近比较了 3D XY 临界状态、Ginzburg-Landau 行为和二流体模型。我们的数据表明，前一种方法最好地遵循观察到的依赖性。
The technique proposed by authors earlier for accurate measurement of large-area HTS thin film surface resistance (R/sub s/) is developed further. It is based on application of quasioptical dielectric resonators (QDR). Data on R/sub s/ of individual Y-123 films obtained at 77 K by using "round robin" procedure are presented. The main attention is paid to developing technique of temperature dependence measurement of thin film surface reactance variation (/spl Delta/X/sub s/). The dependence obtained by experiment is analyzed by means of fitting procedure that allows one to determine the validity of theoretical models for the temperature dependence of field penetration depth. Particularly, the 3D XY critical regime, Ginzburg-Landau behavior and two-fluid model are compared near T/sub c/. Our data show that the former approach best follows the observed dependence.