New CsI/a-Si 17" x 17" x-ray flat-panel detector provides superior detectivity and immediate direct digital output for general radiography systems
New CsI/a-Si 17" x 17" x-ray flat-panel detector provides superior detectivity and immediate direct digital output for general radiography systems
复制标题
新型 CsI/a-Si 17" x 17" X 射线平板探测器为通用放射线照相系统提供卓越的探测能力和即时直接数字输出
DOI:
10.1117/12.317049
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发表时间:
1998
影响因子:
--
通讯作者:
Robert Neyret
中科院分区:
文献类型:
--
作者:
C. Chaussat;J. Chabbal;T. Ducourant;Vincent Spinnler;G. Vieux;Robert Neyret
A new 17' X 17' immediate direct digital flat panel detector has been developed to fit the needs of General Radiography. After reviewing a few key aspects of the General Radiography needs (X-ray energy range and associated measurement conditions, system integration and system operation), we describe the new detector Cesium Iodide/Amorphous Silicon based technology, and give measurement results (MTF, DQE stability). We compare the new detector performance to existing technologies (film/screen combination, storage phosphor devices) and also to other flat panel solutions (Selenium). We conclude that the CsI/a-Si technology is now the best suited one in order to fit the needs of General Radiography, this means all kinds of examinations (chest, abdomen, bones, extremities. . .) which have been up to now done using films.