Rietveld quantification of γ-C2S conversion rate supported by synchrotron X-ray diffraction images
Rietveld quantification of γ-C2S conversion rate supported by synchrotron X-ray diffraction images
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DOI：
10.1631/jzus.a1300215
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发表时间：
2013-11
期刊：
影响因子：
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通讯作者：
Pi-qi Zhao;Xianping Liu;Jianguo Wu;Pei-ming Wang
中科院分区：
文献类型：
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作者：
Pi-qi Zhao;Xianping Liu;Jianguo Wu;Pei-ming Wang
在煅烧温度1623 K，保温时间10 h，炉冷条件下，制备出纯相γ-Ca 2SiO 4（γ-C2 S）。采用1473 K煅烧，保温1 h后水冷的煅烧制度，γ-C2 S转化为β-C2 S相。利用同步辐射X射线衍射图像支持的Rietveld定量实验室X射线粉末衍射研究了γ-C2 S的转化率。精制结果表明，γ-C2 S的最终转化率大于92%。两种Rietveld方法（含α-Al 2 O3和不含α-Al 2 O3样品）对γ-C2 S转化率的绝对误差为3.6%，表明Rietveld定量X射线衍射分析是一种合适和准确的γ-C2 S转化率定量方法。
The pure γ-Ca2SiO4 (γ-C2S) phase was prepared at 1623 K of calcining temperature, 10 h of holding time and furnace cooling. The β-C2S phase was obtained through γ-C2S conversion with the following calcination system which was adopted at 1473 K of calcining temperature, 1 h of holding time and then water-cooling. The conversion rate of γ-C2S was studied by the Rietveld quantitative laboratory X-ray powder diffraction supported by synchrotron X-ray diffraction images. The refinement results show that the final conversion rate of γ-C2S is higher than 92%. The absolute error of the γ-C2S conversion rate between two Rietveld refinements (sample with or without α-Al2O3) is 3.6%, which shows that the Rietveld quantitative X-ray diffraction analysis is an appropriate and accurate method to quantify the γ-C2S conversion rate.