Measurement and energy correction due to charge carrier lifetimes in large HPGe spectrometers
Measurement and energy correction due to charge carrier lifetimes in large HPGe spectrometers
复制标题
大型 HPGe 光谱仪中载流子寿命的测量和能量校正
DOI：
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复制
发表时间：
2009
期刊：
影响因子：
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通讯作者：
H. Miley
中科院分区：
文献类型：
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作者：
J. Kephart;C. Aalseth;H. Miley
这项工作解决了由于在较大的HPGe光谱仪中增加电荷载流子收集时间而导致的能谱校正。预计辐射相互作用的能量与所收集的总电荷成正比。对于更大的HPGe光谱仪来说，这种情况越来越不成立。当总电荷从相互作用位置移动到收集电极时，一些电荷丢失。这种路径相关的电荷损失导致能量分辨率降低。在HPGe光谱仪中，这一过程的特征是载流子寿命常数，并以载流子收集时间除以该常数的指数函数给出。因此，随着载流子收集时间的增加，大型探测器的能量分辨率会呈指数级下降。利用脉冲形状分析方法研究了载流子寿命对p型点接触型HPGe光谱仪能量分辨率的影响。我们提出了一种方法，利用上升时间来校正一个脉冲的载流子寿命对一个给定的HPGe光谱仪。
This work addresses the energy spectrum correction due to increased charge carrier collection times in larger HPGe spectrometers. The energy of the radiation interaction is expected to be proportional to the total collected charge. This is increasingly not true with larger HPGe spectrometers. Some charge is lost as the total charge travels from the interaction location to the collection electrode. This path dependent loss of charge results in decreased energy resolution. In HPGe spectrometers, this process is characterized by the charge carrier lifetime constant and is given as an exponential function of the charge carrier collection time divided by this constant. Thus large detectors can experience exponential decrease in energy resolution as charge carrier collection time increases. We studied the effect of charge carrier lifetime on energy resolution for a p-type point contact HPGe spectrometers using pulse shape analysis. We present a method using the rise time to correct for the charge carrier lifetime on a pulse by pulse basis for a given HPGe spectrometer.