Rapid low dose electron tomography using a direct electron detection camera.
Rapid low dose electron tomography using a direct electron detection camera.
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DOI：
10.1038/srep14516
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发表时间：
2015-10-05
影响因子：
4.6
通讯作者：
Dunin-Borkowski RE
中科院分区：
文献类型：
--
作者：
Migunov V;Ryll H;Zhuge X;Simson M;Strüder L;Batenburg KJ;Houben L;Dunin-Borkowski RE
我们证明了在透射电子显微镜中使用直接电子探测器在仅3.5 s内记录包含3487个图像的层析倾斜系列的能力。当与用于在15-60分钟内记录少于100个图像的常规倾斜系列的电子剂量相比时，电子剂量低至少一个数量级，并且总信噪比大于4。我们的研究结果，这是说明了无机纳米管，是非常重要的超低剂量电子断层扫描的电子束敏感的标本和实时动态电子断层扫描的纳米级物体亚毫秒的时间分辨率。
We demonstrate the ability to record a tomographic tilt series containing 3487 images in only 3.5 s by using a direct electron detector in a transmission electron microscope. The electron dose is lower by at least one order of magnitude when compared with that used to record a conventional tilt series of fewer than 100 images in 15–60 minutes and the overall signal-to-noise ratio is greater than 4. Our results, which are illustrated for an inorganic nanotube, are important for ultra-low-dose electron tomography of electron-beam-sensitive specimens and real-time dynamic electron tomography of nanoscale objects with sub-ms temporal resolution.