Correlation of stress and magnetic anisotropy in cocrpt/cr films grown on textured substrates
Correlation of stress and magnetic anisotropy in cocrpt/cr films grown on textured substrates
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DOI：
10.1109/20.908417
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发表时间：
2000-04
期刊：
影响因子：
--
通讯作者：
D. J. Twisselmann;Y. Shine;C. Ross
中科院分区：
文献类型：
--
作者：
D. J. Twisselmann;Y. Shine;C. Ross
研究了在光滑和光刻纹理硅基底上生长的 Cr 和 CoCrPt/Cr 薄膜中的应力，以研究凹槽纵向磁记录介质中磁各向异性的起源。从 Cr(110) 到 Cr(200) 取向的晶体织构变化与大的应力变化相关。探讨了凹槽样品中应力各向异性引起的磁致伸缩效应。
Stress in Cr and CoCrPt/Cr films grown on smooth and lithographically textured silicon substrates were studied to investigate the origins of magnetic anisotropy in grooved longitudinal magnetic recording media. Crystallographic texture changes from Cr(110) to Cr(200) orientations are correlated with large stress changes. Magnetostrictive effects due to stress anisotropy in grooved samples are explored.