Generalized Fault Modeling for Logic Diagnosis
Generalized Fault Modeling for Logic Diagnosis
复制标题
用于逻辑诊断的广义故障建模
DOI：
10.1007/978-90-481-3282-9_5
复制
发表时间：
2010
期刊：
影响因子：
--
通讯作者：
S. Holst
中科院分区：
文献类型：
--
作者：
H. Wunderlich;S. Holst
为了科普纳米电子技术中的众多缺陷机制，越来越多的复杂故障模型被引入。每个模型都有自己的属性和算法，用于测试生成和逻辑诊断。然而，在诊断中，故障设备的缺陷机制事先并不知道，并且假设特定故障模型的算法可能失败。因此，诊断技术已被提出，放松故障假设，甚至没有任何故障模型的工作。在这一章中，我们建立了一个通用的故障建模技术和符号。基于这个符号，我们描述和分类现有的模型和研究的故障模型独立诊断技术的属性。
To cope with the numerous defect mechanisms in nanoelectronic technology, more and more complex fault models have been introduced. Each model comes with its own properties and algorithms for test generation and logic diagnosis. In diagnosis, however, the defect mechanisms of a failing device are not known in advance, and algorithms that assume a specific fault model may fail. Therefore, diagnosis techniques have been proposed that relax fault assumptions or even work without any fault model. In this chapter, we establish a generalized fault modeling technique and notation. Based on this notation, we describe and classify existing models and investigate the properties of a fault model independent diagnosis technique.