DC offsets in direct-conversion receivers: Characterization and implications

DC offsets in direct-conversion receivers: Characterization and implications
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DOI:
10.1109/mmw.2005.1511916
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发表时间:
2005-09-01
影响因子:
3.6
通讯作者:
Raman, S
Raman, S
中科院分区:
计算机科学3区
文献类型:
--
作者:
Svitek, R;Raman, S

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由于直流偏置会对直接转换接收器的性能产生很大的负面影响,因此确定给定设计的偏置性能非常重要。本文讨论了一种可用于表征和测量DCR电路应用中的直流偏置的技术。直流偏移量是DCRS设计中的一个主要问题,必须在确定特定接收器设计的性能时进行表征。通过分步骤测量DCR前端输出端的直流电平,可以解决偏移量的来源--器件失配、LO自混合和二阶非线性。
Since DC-offsets can have a large, negative impact on the performance of direct-conversion receivers, it is important to determine the offset performance of a given design. This article discusses one technique that can be used to characterize and measure dc-offsets in DCR circuit applications. DC-offsets are a primary concern in the design of DCRs and must be characterized in determining the performance of a particular receiver design. By measuring the dc level at the output of a DCR front-end in separate steps, the source of the offsets - device mismatches, LO self-mixing, and second order nonlinearities - can be resolved.