Photothermal single particle microscopy using a single laser beam
Photothermal single particle microscopy using a single laser beam
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DOI：
10.1063/1.4890104
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发表时间：
2014-07-07
影响因子：
4
通讯作者：
Cichos, Frank
中科院分区：
文献类型：
--
作者：
Selmke, Markus;Heber, Andre;Cichos, Frank
我们介绍了一个单激光束光热显微镜计划，用于检测单个吸收纳米物体。这里，具有恒定强度偏移的调制入射激光束同时用作泵浦和探测光束。利用延迟热折射波场的异相散射响应，该方法提供了一个选择性的对比度的吸收超过一个可能的散射体的背景。使用单一波长和单一光束，大大简化了现有显微镜方案中光热检测的设置和集成。(C)2014 AIP Publishing LLC.
We introduce a single-laser-beam photothermal microscopy scheme for the detection of single absorbing nano-objects. Here, a modulated incident laser beam with a constant intensity offset serves as pump and probe beam at the same time. Using the out-of-phase scattering response of the retarded thermorefractive wave field, the method provides a selective contrast for absorbers over a possible background of scatterers. The use of a single wavelength and a single beam, considerably simplifies the setup and integration of photothermal detection in existing microscopy schemes. (C) 2014 AIP Publishing LLC.