Investigation of the anodic oxide layer/SiC interface morphology during anodic oxidation assisted polishing

Investigation of the anodic oxide layer/SiC interface morphology during anodic oxidation assisted polishing
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阳极氧化辅助抛光过程中阳极氧化层/SiC界面形貌的研究

DOI:
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发表时间:
2014
期刊:
影响因子:
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通讯作者:
K. Yamamura
K. Yamamura
中科院分区:
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文献类型:
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作者:
K. Hosoya;Y. Imanishi;K. Endo;K. Yamamura

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