The dynamic T 2 chart for monitoring feedback-controlled processes
The dynamic T 2 chart for monitoring feedback-controlled processes
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DOI：
10.1080/07408170208928933
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发表时间：
2002-12
期刊：
影响因子：
--
通讯作者：
F. Tsung;D. Apley
中科院分区：
文献类型：
--
作者：
F. Tsung;D. Apley
随着制造质量成为全球市场竞争的决定性因素，以统计过程控制（SPC）为代表的统计质量技术在工业中得到了广泛的应用。随着信息、传感和数据收集技术的进步，在采用自动过程控制（APC）和工程过程控制（EPC）的过程中，大量数据是常规可用的。尽管在这些反馈控制的环境中对SPC监控的需求越来越大，但仍然缺乏有效的实施方案。这项研究提供了一种监测方法，称为动态T1图，提高了可分配的原因在反馈控制过程中的检测。
As manufacturing quality has become a decisive factor in global market competition, statistical quality techniques such as Statistical Process Control (SPC) are widely used in industry. With advances in information, sensing, and data collection technology, large volumes of data are routinely available in processes employing Automatic Process Control (APC) and Engineering Process Control (EPC). Although there is a growing need for SPC monitoring in these feedback-controlled environments, an effective implementation scheme is still lacking. This research provides a monitoring method, termed the dynamic T1 chart that improves the detection of assignable causes in feedback-controlled processes.