Epitaxial growth of corundum-structured wide band gap III-oxide semiconductor thin films
Epitaxial growth of corundum-structured wide band gap III-oxide semiconductor thin films
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DOI:
10.1016/j.jcrysgro.2014.02.032
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发表时间:
2014-09-01
影响因子:
1.8
通讯作者:
Kaneko, Kentaro
中科院分区:
文献类型:
--
作者:
Fujita, Shizuo;Kaneko, Kentaro
We report fundamental issues and prospects of the rhombohedral corundum-structured III-oxide (III-O) alloy system constituted with alpha-M2O3 (M=metal element) materials. Successful epitaxial growth of alpha-Ga2O3 and alpha-In2O3 on sapphire (alpha-Al2O3) substrates has enabled the growth of alpha-(Al,Ga,In)(2)O-3 semiconductor alloys, achieving the "band gap engineering" from 3.8 eV (an experimental value) to 8.8 eV. Transition-metal corundum-structured oxides (M=Cr, Fe, V, Ti) can be alloyed with the alpha-(Al,Ga,In)(2)O-3 semiconductor alloys, leading to "function engineering", that is, to tailor the materials functions. The corundum-structured III-O alloys will contribute to novel multifunctional devices in the future. (C) 2014 Elsevier B.V. All rights reserved.