Bright Field Structural Colors in Silicon-on-Insulator Nanostructures
Bright Field Structural Colors in Silicon-on-Insulator Nanostructures
复制标题
绝缘体上硅纳米结构中的明场结构颜色
DOI:
10.1021/acsami.0c19126
复制
发表时间:
2021-01-04
影响因子:
9.5
通讯作者:
Shi, Lina
中科院分区:
文献类型:
--
作者:
Li, Longjie;Niu, Jiebin;Shi, Lina
Structural coloration with artificially nanostructured materials is emerging as a prospective alternative to traditional pigments for the high resolution, sustainable recycling, and long-time durability. However, achieving bright field structural colors with dielectric nanostructures remains a great challenge due to the weak scattering in an asymmetric environment. Here, we demonstrate all-dielectric bright field structural colors with diffraction-limited resolution on the silicon-on-insulator platform. The backscattering is strongly enhanced from the constructive interference between Mie resonances of individual Si antennas and Fabry-Perot resonances supported by the SiO2 layer. The fabricated colors with varying hues and saturations show strong insensitivity with respect to the interparticle spacing and, remarkably, the viewing angle under resonant conditions. Compared with creating a quasi-homogeneous environment, our strategy is solid and complementary metal-oxide semiconductor integrable, paving the way for practical applications of structural colors in nanoscale color printing, microdisplays, and imaging.