Single-shot time-resolved measurements of nanosecond-scale spin-transfer induced switching: Stochastic versus deterministic aspects
Single-shot time-resolved measurements of nanosecond-scale spin-transfer induced switching: Stochastic versus deterministic aspects
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DOI：
10.1103/physrevlett.100.057206
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发表时间：
2008-02-08
影响因子：
8.6
通讯作者：
Ohno, H.
中科院分区：
文献类型：
--
作者：
Devolder, T.;Hayakawa, J.;Ohno, H.
利用高带宽电阻测量，我们研究了自旋力矩脉冲作用下隧道结的单次响应。在脉冲开始后，切换进行了一个ns-规模的孵化延迟期间，电阻是安静的，随后由一个大的振铃，阻尼逐渐终止400 ps的过渡。虽然孵育延迟显著波动，但一旦经过该延迟，电阻迹线是可再现的。切换后，时间分辨的电阻迹线表示微磁配置，而空间相干。
Using high bandwidth resistance measurements, we study the single-shot response of tunnel junctions subjected to spin torque pulses. After the pulse onset, the switching proceeds by a ns-scale incubation delay during which the resistance is quiet, followed by a 400 ps transition terminated by a large ringing that is damped progressively. While the incubation delay fluctuates significantly, the resistance traces are reproducible once this delay is passed. After switching, the time-resolved resistance traces indicate micromagnetic configurations that are rather spatially coherent.