Functionalized Akiyama tips for magnetic force microscopy measurements
Functionalized Akiyama tips for magnetic force microscopy measurements
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用于磁力显微镜测量的功能化 Akiyama 尖端
DOI：
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发表时间：
2017
期刊：
影响因子：
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通讯作者：
B. Abel
中科院分区：
文献类型：
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作者：
M. Stiller;J. Barzola;P. Esquinazi;S. Sangiao;J. D. de Teresa;J. Meijer;B. Abel
在这项工作中，我们已经使用了聚焦电子束诱导沉积钴功能化原子力显微镜秋山提示磁力显微镜中的应用。在暴露于环境空气后，生长的尖端具有~ 90%Co的含量。的磁性提示，其特征在于使用能量色散X射线光谱和扫描电子显微镜。为了研究磁性能，通过电子束光刻制备了电流环。在室温以及4.2 K进行了测量，并通过在尖端磁化的相反方向上施加几个外部场来估计Co尖端的矫顽场为1.68 mT。磁性秋山尖端为宽范围温度磁力显微镜测量开辟了新的可能性。
In this work we have used focused electron beam induced deposition of cobalt to functionalize atomic force microscopy Akiyama tips for application in magnetic force microscopy. The grown tips have a content of ≈90 % Co after exposure to ambient air. The magnetic tips were characterized using energy dispersive x-ray spectroscopy and scanning electron microscopy. In order to investigate the magnetic properties, current loops were prepared by electron beam lithography. Measurements at room temperature as well as 4.2 K were carried out and the coercive field of ≈6.8 mT of the Co tip was estimated by applying several external fields in the opposite direction of the tip magnetization. Magnetic Akiyama tips open new possibilities for wide-range temperature magnetic force microscopy measurements.