Blind optical sectioning and super-resolution imaging in multifocal structured illumination microscopy
Blind optical sectioning and super-resolution imaging in multifocal structured illumination microscopy
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DOI：
10.1016/j.optcom.2022.127981
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发表时间：
2022-01
影响因子：
2.4
通讯作者：
Jinhua Geng;Bin Yu;Wei Zhang;Jiongguang Zhu;Binhui Zhang;Weihao Chen;Sitao Chen;J. Qu
中科院分区：
文献类型：
--
作者：
Jinhua Geng;Bin Yu;Wei Zhang;Jiongguang Zhu;Binhui Zhang;Weihao Chen;Sitao Chen;J. Qu
使用稀疏多点图案，多焦点结构照明显微镜 (MSIM) 可以检索厚样品的 3D 结构，并提高横向分辨率。在现有的MSIM技术中，准确的显微镜参数和捕获图像中照明焦点的位置对于抑制离焦光和提高横向分辨率至关重要。因此，在这些 MSIM 技术中应该执行繁琐的校准程序。因此，本文提出了一种MSIM中的盲光学切片和超分辨率（OS-SR）成像方法。所提出的方法结合了反卷积方法和标准偏差方法。无需校准显微镜的精确参数和焦点位置即可获得OS-SR图像。仿真和实验结果证明了该方法的有效性。
Using sparse multi-spot patterns, multifocal structured illumination microscopy (MSIM) can retrieve the 3D structures of thick samples with improved lateral resolution. In the existing MSIM techniques, the accurate parameters of microscope and positions of the illumination focus in the captured images are essential for suppressing the out-of-focus light and improving the lateral resolution. Tedious calibration procedures thus should be carried out in these MSIM techniques. Hence, a blind optical sectioning and super-resolution (OS-SR) imaging method in MSIM is proposed in this paper. The proposed method combines a deconvolution method with the standard deviation method. It can achieve OS-SR images without calibrating the accurate parameters of microscope and the positions of the foci. The validity of the proposed method is demonstrated by simulation and experimental results.