Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier-Based Test Structure
Statistical Characterization and On-Chip Measurement Methods for Local Random Variability of a Process Using Sense-Amplifier-Based Test Structure
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使用基于检测放大器的测试结构的过程局部随机变异性的统计表征和片上测量方法
DOI：
10.1109/isscc.2007.373463
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发表时间：
2007
期刊：
影响因子：
--
通讯作者：
K. Roy
中科院分区：
文献类型：
--
作者：
S. Mukhopadhyay;Keunwoo Kim;K. Jenkins;C. Chuang;K. Roy
提出了一种过程局部随机变化的片上数字表征方法。该方法使用基于传感器放大器的测试电路，该电路使用数字电压测量代替传统技术的模拟电流测量。所提出的电路有助于设计快速的片上内置自检方案来测量随机变化。在0.13 μ m CMOS上设计了测试芯片，并进行了测试，验证了该电路在提取局部随机变化方面的有效性。
An on-chip digital characterization method for local random variation in a process is presented. The method uses a sense-amplifier-based test circuit that uses digital voltage measurement instead of the analog current measurements of conventional techniques. The proposed circuit helps design fast on-chip built-in-self-test schemes for measuring random variation. A testchip is designed in 0.13mum CMOS and measured to show the effectiveness of the proposed circuit in extracting local random variation.