Diffraction phase microscopy: principles and applications in materials and life sciences
Diffraction phase microscopy: principles and applications in materials and life sciences
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DOI：
10.1364/aop.6.000057
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发表时间：
2014-03-01
影响因子：
27.1
通讯作者：
Popescu, Gabriel
中科院分区：
文献类型：
--
作者：
Bhaduri, Basanta;Edwards, Chris;Popescu, Gabriel
在检索定量相位与高灵敏度的主要障碍是由相位噪声，由于机械振动和空气波动，通常会影响任何干涉系统。在本文中，我们回顾了衍射相位显微术（XRD），这是一个共同的路径定量相位成像（QPI）的方法，显着消除噪声问题。QPI利用紧凑的马赫-曾德尔干涉仪来联合收割机结合当前QPI方法的几个属性。这种紧凑的配置本质上消除了大多数造成噪声的机制，并且是单次拍摄，这意味着采集速度仅受所采用的相机速度的限制。这种技术也是无损的，不需要染色或涂层的标本。这种独特的功能集合使该系统能够准确地监测各种环境中各种纳米级现象的动态。该系统可以在透射和反射模式下操作，以分别适应透明和不透明样品。因此，目前的应用包括测量生物样品的动力学，半导体湿法蚀刻和光化学蚀刻工艺，表面润湿和水滴蒸发，纳米管的自组装，材料的膨胀和变形，以及半导体晶片缺陷检测。最后，用白色光照射平均掉大部分斑点背景，也为光谱测量提供了可能。(C)2014年美国光学学会
The main obstacle in retrieving quantitative phase with high sensitivity is posed by the phase noise due to mechanical vibrations and air fluctuations that typically affect any interferometric system. In this paper, we review diffraction phase microscopy (DPM), which is a common-path quantitative phase imaging (QPI) method that significantly alleviates the noise problem. DPM utilizes a compact Mach-Zehnder interferometer to combine several attributes of current QPI methods. This compact configuration inherently cancels out most mechanisms responsible for noise and is single-shot, meaning that the acquisition speed is limited only by the speed of the camera employed. This technique is also nondestructive and does not require staining or coating of the specimen. This unique collection of features enables the DPM system to accurately monitor the dynamics of various nanoscale phenomena in a wide variety of environments. The DPM system can operate in both transmission and reflection modes in order to accommodate both transparent and opaque samples, respectively. Thus, current applications of DPM include measuring the dynamics of biological samples, semiconductor wet etching and photochemical etching processes, surface wetting and evaporation of water droplets, self-assembly of nanotubes, expansion and deformation of materials, and semiconductor wafer defect detection. Finally, DPM with white light averages out much of the speckle background and also offers potential for spectroscopic measurements. (C) 2014 Optical Society of America