Activities at the Tokyo EBIT 2010
Activities at the Tokyo EBIT 2010
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DOI：
10.1088/1748-0221/5/08/c08007
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发表时间：
2010-08
影响因子：
1.3
通讯作者：
N. Nakamura;F. Currell;Zhimin Hu;D. Kato;A. Komatsu;Yichen Li;I. Murakami;H. Ohashi;S. Ohtani-S.
中科院分区：
文献类型：
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作者：
N. Nakamura;F. Currell;Zhimin Hu;D. Kato;A. Komatsu;Yichen Li;I. Murakami;H. Ohashi;S. Ohtani-S.
在本文中，我们介绍了最近的活动在东京息税前利润后，给出了设备的现状的概述。我们用几种方法研究了双电子复合过程。除了X射线观测和电荷丰度观测外，双光子观测最近已被用于研究连续发射两个光子（但实际上是同时发射）的DR过程。近年来的光谱工作主要集中在与天体物理和聚变等离子体有关的Fe和W离子。几个光谱仪，可以覆盖广泛的波长范围，如可见光，EUV和X射线，用于积累有用的数据，等离子体诊断应用。HCl-表面碰撞过程进行了研究，通过束线，最近已修改提取的离子。非常高度带电的离子高达Bi 81+被用于研究巨大的势能的影响。
In this paper, we present recent activities at the Tokyo EBIT after giving an overview of the present status of the devices. We have been studying dielectronic recombination processes by means of several techniques. In addition to X-ray observations and charge abundance observations, 2-photon observations have been recently used to study DR processes which emit two photons successively (but practically simultaneously). Recent efforts on spectroscopic work are mainly concentrated on Fe and W ions, which are relevant to astrophysical and fusion plasmas. Several spectrometers that can cover a wide range of wavelength, such as visible, EUV, and X-rays, were used for accumulating useful data for plasma diagnostics applications. HCI-surface collision processes were studied using ions extracted through the beam line, that has recently been modified. Very highly charged ions up to Bi81+ were used for studying the effect of huge potential energy.