Pressure cell for investigations of solid-liquid interfaces by neutron reflectivity.
Pressure cell for investigations of solid-liquid interfaces by neutron reflectivity.
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用于通过中子反射率研究固液界面的压力盒。
DOI：
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发表时间：
2011
影响因子：
1.6
通讯作者：
R. Dahint
中科院分区：
文献类型：
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作者：
M. Kreuzer;T. Kaltofen;R. Steitz;B. Zehnder;R. Dahint
我们描述了一种在高静水压条件下测量平面固液界面处的散射长度密度和分子层结构的装置。该设备设计用于在 5 至 60°C 的温度下，在 0.1-100 MPa 的压力范围内利用中子反射计进行原位表征。压力盒的构造使得可以针对非腐蚀性液相研究表面积为 28 cm(2) 的硅、石英或蓝宝石晶体基板上的分层分子层。大的基底表面积使得能够测量低至 10(-5) 的反射率（无需背景校正），从而有利于确定跨界面的散射长度密度分布作为所施加负载的函数。我们目前的兴趣是硅表面寡层脂质涂层相对于水相的稳定性，作为施加的静水压力和温度的函数，但该装置也可用于探测任何其他固液界面的结构。
We describe an apparatus for measuring scattering length density and structure of molecular layers at planar solid-liquid interfaces under high hydrostatic pressure conditions. The device is designed for in situ characterizations utilizing neutron reflectometry in the pressure range 0.1-100 MPa at temperatures between 5 and 60 °C. The pressure cell is constructed such that stratified molecular layers on crystalline substrates of silicon, quartz, or sapphire with a surface area of 28 cm(2) can be investigated against noncorrosive liquid phases. The large substrate surface area enables reflectivity to be measured down to 10(-5) (without background correction) and thus facilitates determination of the scattering length density profile across the interface as a function of applied load. Our current interest is on the stability of oligolamellar lipid coatings on silicon surfaces against aqueous phases as a function of applied hydrostatic pressure and temperature but the device can also be employed to probe the structure of any other solid-liquid interface.