High contact resistance readings on clean microwave mobile contacts
High contact resistance readings on clean microwave mobile contacts
复制标题
干净的微波移动触点上的高接触电阻读数
DOI：
10.1109/holm.2004.1353113
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发表时间：
2004
期刊：
影响因子：
--
通讯作者：
J. Bradić
中科院分区：
文献类型：
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作者：
R. Kwiatkowski;M. Vladimirescu;A. Zybura;J. Bradić
在现实生活中，金属表面总是覆盖着某种类型的绝缘膜。这可以通过使用用于接触的贵金属来部分地最小化，但即使在金的情况下，就与环境的反应性而言，这种膜也会发生。因此，接触电阻包括收缩电阻和膜（或隧穿）电阻。已知金在产生摩擦聚合物方面具有很小的亲和力（与铂相比为5%），但已知金在吸收碳原子形成所谓的碳-氧膜方面具有一定的亲和力。对接触电阻高的触点进行分析，发现簧片和探针接触面中存在嵌入的碳和氧。这些碳/氧区域使用标准光学技术（包括UV光）和20至40 x的标准检查放大倍数无法目视识别。X射线光电子能谱（XPS）分析表明，在相应路径的接触区和非接触区，除Au、C和O外，无其它元素存在。同时，测得的碳和氧的键能，证实了最可能的碳质单层的组合物。在评估中作为背景的非接触区域的组成略有不同，但具有相同类型的碳结构，即结合能。对各种接触进行的XPS测量表明，这种膜的厚度通常小于10 nm。该工作提出了一种分析，该分析表明，基于RF数据解释，移动的接触构件和固定接触构件紧密接触，并且绝缘层的等效介电常数高于1。此外，还利用R.霍尔姆和K. E.皮特尼，有可能获得与实验数据相当的高接触电阻读数。论文还探讨了测试方法和限制方面的能力，以检测隧道传导通过一定厚度的表面膜。
In a real-life environment, metallic surfaces are always covered with an insulating film of some type. This can be partly minimized by the use of noble metals for contacts, but even in case of gold, the best material in terms of reactivity with the environment, such films occur. The contact resistance consists therefore in constriction resistance and film (or tunneling) resistance. Gold is known to have little affinity in creating frictional polymers (5% when compared with platinum) but it is known to have some affinity regarding absorption of carbon atoms forming the so-called carbon-oxygen film. Analysis of contacts that exhibited high contact resistance revealed presence of carbon and oxygen imbedded in the reed and probe contact surfaces. These carbon/oxygen areas were not visually identifiable using standard optical techniques, including UV light, and standard inspection magnification of 20 to 40 x. X-ray photo-electron spectroscopy (XPS) analysis revealed that there were no other elements present in the contact and non contact areas of the corresponding paths except Au, C and O. At the same time, measured bonding energies for carbon and oxygen, confirmed the most probable composition of the carbonaceous monolayer. Non-contact areas taken as a background in the evaluation had slightly different composition, however with the same type of carbon structures i.e. bonding energies. XPS measurements conducted on various contacts showed that the thickness of such a film is usually less than 10 nm. The work presents an analysis that shows, based on RF data interpretation, that the mobile contact member and the fixed contact member were in intimate contact and the equivalent dielectric constant of the insulating layer is higher than one. In addition, using typical values for the tunnel resistivity presented in reference books by R. Holm and K. E. Pitney it is possible to obtain high contact resistance readings comparable with the experimental data. Paper also examines test methodology and limitations in terms of ability to detect tunnel conduction through certain thicknesses of surface films.