Effects on hard x-ray response of a double-sided Si strip detector caused by interstrip surface charge
Effects on hard x-ray response of a double-sided Si strip detector caused by interstrip surface charge
复制标题
带间表面电荷对双面硅带探测器硬X射线响应的影响
DOI：
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发表时间：
2016
期刊：
影响因子：
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通讯作者：
and Tadayuki Takahash
中科院分区：
文献类型：
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作者：
Katsuma Miyake;Shinya Saito;Toshio Nakano;Koichi Hagino;Shogo Benjamin Kobayashi;Kazufumi Okuda;Taketo Mimura;Goro Sato;Shin Watanabe;Motohide Kokubun;Kazuhiro Nakazawa;Shinichiro Takeda;Hiroyasu Tajima;Yasushi Fukazawa;and Tadayuki Takahash
