Development of Unified Predictive NBTI Model and its Application for Circuit Aging Simulation
Development of Unified Predictive NBTI Model and its Application for Circuit Aging Simulation
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统一预测NBTI模型的建立及其在电路老化仿真中的应用
DOI:
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发表时间:
2013
期刊:
影响因子:
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通讯作者:
and M. Miura-Mattausch
中科院分区:
文献类型:
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作者:
C. Ma;H. J. Mattausch;M. Miyake;T. Iizuka;K. Matsuzawa;S. Yamaguchi;T. Hoshida;A. Kinoshita;T. Arakawa;J. He;and M. Miura-Mattausch