A new technique for the observation of X-ray CTR scattering by using an imaging plate detector
A new technique for the observation of X-ray CTR scattering by using an imaging plate detector
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利用成像板探测器观察X射线CTR散射的新技术
DOI：
10.1107/s0021889892010239
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发表时间：
1993
影响因子：
6.1
通讯作者：
J. Harada
中科院分区：
文献类型：
--
作者：
T. Shimura;J. Harada
发展了一种利用成像板(IP)探测器观测X射线晶体截断棒(CTR)散射的新技术。将激电探测器与同步辐射(SR)源结合使用是观测CTR散射的非常有效的方法。通过观察各种样品的CTR散射的例子，指出了这种技术的优点和缺点：Si(111)晶片的自然氧化表面；在GaAs(001)衬底上分子束外延生长的GaAs/AlAs/GaAs；在Si(111)衬底上覆盖Al的GaAs；以及解理的NaCl(001)表面。它还表明，如果拍摄一张静止的照片，可以将观测到的CTR散射强度转换为绝对尺度。
A new technique, using an Imaging Plate (IP) detector, was developed for the observation of X-ray crystal truncation rod (CTR) scattering. The use of an IP detector in conjunction with a synchrotron-radiation (SR) source is very effective for the observation of CTR scattering. The advantages and disadvantages of this technique are indicated by examples of the observation of CTR scattering from various samples: a naturally oxidized surface of an Si(111) wafer; MBE-grown GaAs/AlAs/GaAs on GaAs(001) substrate; Al-capped GaAs on an Si(111) substrate; and a cleavage NaCl(001) surface. It is also shown that it is possible to convert the observed intensity of the CTR scattering to an absolute scale if a stationary photograph is taken.