Non-Concurrent On-Line Testing Via Scan Chains
Non-Concurrent On-Line Testing Via Scan Chains
复制标题
通过扫描链进行非并发在线测试
DOI：
10.1109/autest.2006.283749
复制
发表时间：
2006
期刊：
影响因子：
--
通讯作者：
P. Moore
中科院分区：
文献类型：
--
作者：
H. Al;P. Moore
随着操作故障成为现代超大规模集成电路失效模式的主要原因，在线测试技术的广泛应用变得至关重要。本文提出了一种基于扫描链的非并发在线测试技术。我们讨论了设计中需要的修改，以便可以使用我们的技术在线测试。我们在流水线8 × 8乘法和累加单元的案例研究中演示了我们的技术。案例研究表明，我们的技术具有高错误覆盖率、中等硬件开销和可忽略的时间冗余的特点。
With operational faults becoming the dominant cause of failure modes in modern VLSI, widespread deployment of on-line test technology has become crucial. In this paper, we present a non-concurrent on-line testing technique via scan chains. We discuss the modifications needed in the design so that it can be tested on-line using our technique. We demonstrate our technique on a case study of a pipelined 8 x 8 multiply and accumulate unit. The case study shows that our technique is characterized by high error coverage, moderate hardware overhead, and negligible time redundancy.