A Variational Theory for Point Defects in Patterns
A Variational Theory for Point Defects in Patterns
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DOI：
10.1007/s00332-008-9035-9
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发表时间：
2009-06-01
影响因子：
3
通讯作者：
Venkataramani, S. C.
中科院分区：
文献类型：
--
作者：
Ercolani, N. M.;Venkataramani, S. C.
在远离阈值的图案形成的正则化Cross-Newell模型的自然版本中，我们推导出了关于极小值的严格标度律。这些能量最小化的解决方案支持具有与相应物理系统的实验研究以及描述这些系统的微观方程的数值模拟中所看到的相同特征的缺陷。
We derive a rigorous scaling law for minimizers in a natural version of the regularized Cross-Newell model for pattern formation far from threshold. These energy-minimizing solutions support defects having the same character as what is seen in experimental studies of the corresponding physical systems and in numerical simulations of the microscopic equations that describe these systems.