High resolution cold stage for the JEOL 100B and 100C electron microscopes.
High resolution cold stage for the JEOL 100B and 100C electron microscopes.
复制标题
适用于 JEOL 100B 和 100C 电子显微镜的高分辨率冷台。
作者：
Steven B. Hayward;Robert M. Glaeser
