Improved SERS Performance from Au Nanopillar Arrays by Abridging the Pillar Tip Spacing by Ag Sputtering
Improved SERS Performance from Au Nanopillar Arrays by Abridging the Pillar Tip Spacing by Ag Sputtering
复制标题
通过银溅射缩短柱尖间距，提高金纳米柱阵列的 SERS 性能
DOI：
10.1002/adma.201001179
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发表时间：
2010-10-01
影响因子：
29.4
通讯作者：
Tang, Chaolong
中科院分区：
文献类型：
--
作者：
Huang, Zhulin;Meng, Guowen;Tang, Chaolong
当使用10 nM R6 G作为探针分子时，在树脂支撑体上的Ag-封端的Au纳米柱阵列（见左上图）（具有10 nm的典型相邻柱尖端间隙）显示出比裸Au纳米柱阵列明显更高的表面增强拉曼散射（Sers）灵敏度（红色的右柱）。大面积银包覆Au纳米柱阵列在特殊化学物质的痕量检测中具有潜在的应用价值。
Ag-capped Au nanopillar arrays on a resin supporter (see left upper figure), with a typical adjacent pillar tip gap of 10 nm, show obviously higher surface-enhanced Raman scattering (SERS) sensitivity (right column in red) than that of the bare Au nanopillar array while using 10 nM R6G as probe molecules. The large-area Ag-capped Au nanopillar array has potential in trace detection of special chemicals.