Interlayer structures of the chiral smectic liquid crystal phases revealed by resonant X-ray scattering.
Interlayer structures of the chiral smectic liquid crystal phases revealed by resonant X-ray scattering.
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通过共振 X 射线散射揭示手性近晶液晶相的层间结构。
DOI：
10.1103/physreve.65.041705
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发表时间：
2002
期刊：
影响因子：
--
通讯作者：
M. Hird
中科院分区：
文献类型：
--
作者：
L. Hirst;S. J. Watson;H. Gleeson;P. Cluzeau;P. Barois;R. Pindak;J. Pitney;A. Cady;P. M. Johnson;C. C. Huang;A. Levelut;G. Srajer;J. Pollmann;W. Caliebe;A. Seed;M. Herbert;J. Goodby;M. Hird
用共振X射线散射技术研究了几种含硒或硫原子的材料的液晶手性亚相的结构。这种技术提供了一个独特的结构探针的铁电，铁电，反铁电，和SmC（*）（α）相。散射特征的分析允许区分不同子相的结构模型，除了提供螺距的测量之外。本文报道了反铁电六角相、三层和四层中间相、反铁电相和铁电相以及SmC（*）（α）相的共振散射特性。螺旋节距已被测量从散射峰在四层中间相以及在反铁电和铁电相。在SmC（*）（α）相中，对螺旋结构的研究揭示了不同材料中5至54层的螺距。此外，在含硒材料与多达90%的非共振材料的混合物中已经观察到强共振散射信号。
The structures of the liquid crystalline chiral subphases exhibited by several materials containing either a selenium or sulphur atom have been investigated using a resonant x-ray scattering technique. This technique provides a unique structural probe for the ferroelectric, ferrielectric, antiferroelectric, and SmC(*)(alpha) phases. An analysis of the scattering features allows the structural models of the different subphases to be distinguished, in addition to providing a measurement of the helical pitch. This paper reports resonant scattering features in the antiferroelectric hexatic phase, the three- and four-layer intermediate phases, the antiferroelectric and ferroelectric phases and the SmC(*)(alpha) phase. The helicoidal pitch has been measured from the scattering peaks in the four-layer intermediate phase as well as in the antiferroelectric and ferroelectric phases. In the SmC(*)(alpha) phase, an investigation into the helical structure has revealed a pitch ranging from 5 to 54 layers in different materials. Further, a strong resonant scattering signal has been observed in mixtures of a selenium containing material with as much as 90% nonresonant material.