Carrier delocalization in InAs/InGaAlAs/InP quantum-dash-based tunnel injection system for 1.55 µm emission
Carrier delocalization in InAs/InGaAlAs/InP quantum-dash-based tunnel injection system for 1.55 µm emission
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DOI:
10.1063/1.4975634
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发表时间:
2017-01
期刊:
影响因子:
1.6
通讯作者:
Wojciech Rudno‐Rudziński;M. Syperek;J. Andrzejewski;A. Maryński;J. Misiewicz;A. Somers;S. Höfling;J. Reithmaier;G. Sȩk
中科院分区:
文献类型:
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作者:
Wojciech Rudno‐Rudziński;M. Syperek;J. Andrzejewski;A. Maryński;J. Misiewicz;A. Somers;S. Höfling;J. Reithmaier;G. Sȩk
We have investigated optical properties of hybrid two-dimensional-zero-dimensional (2D-0D) tunnel structures containing strongly elongated InAs/InP(001) quantum dots (called quantum dashes), emitting at 1.55 μm. These quantum dashes (QDashes) are separated by a 2.3 nm-width barrier from an InGaAs quantum well (QW), lattice matched to InP. We have tailored quantum-mechanical coupling between the states confined in QDashes and a QW by changing the QW thickness. By combining modulation spectroscopy and photoluminescence excitation, we have determined the energies of all relevant optical transitions in the system and proven the carrier transfer from the QW to the QDashes, which is the fundamental requirement for the tunnel injection scheme. A transformation between 0D and mixed-type 2D-0D character of an electron and a hole confinement in the ground state of the hybrid system have been probed by time-resolved photoluminescence that revealed considerable changes in PL decay time with the QW width changes. The ...