ENERGY GAPS MEASURED BY SCANNING TUNNELING MICROSCOPY
ENERGY GAPS MEASURED BY SCANNING TUNNELING MICROSCOPY
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DOI:
10.1103/physrevb.42.8890
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发表时间:
1990-11-15
影响因子:
3.7
通讯作者:
SUBRAMANIAN, MA
中科院分区:
文献类型:
--
作者:
CHEN, W;GIAMBATTISTA, B;SUBRAMANIAN, MA
A scanning tunneling microscope (STM) has been used to measure energy gaps in the charge-density-wave (CDW) phases of the layer-structure dichalcogenides and in the high-temperature superconductor Bi 2 Sr 2 CaCu 2 O 8. Measured values of Δ CDW at 4.2 K for 2H-TaSe 2, 2H-TaS 2, and 2H-NbSe 2 are 80, 50, and 34 meV giving values of 2 Δ CDW/k B T c equal to 15.2, 15.4, and 23.9, indicating strong coupling in these CDW systems. Measured values of Δ CDW at 4.2 K in 1T-TaSe 2 and 1T-TaS 2 are∼ 150 meV for both materials giving 2 Δ CDW/k B T c≊ 5.8. STM scans of Bi 2 Sr 2 CaCu 2 O 8 at 4.2 K resolve atoms on the BiO x layer and show possible variations in electronic structure. The energy gap determined from I versus V and dI/dV versus V curves is in the range 30–35 meV giving values of 2Δ/k B T c≊ 8. Spectroscopy measurements with the STM can exhibit large zero-bias anomalies which complicate the analysis of the energy-gap structure, but adequate separation has been accomplished.