Comparison of methods for the characterisation by image analysis of crystalline agglomerates: The case of gibbsite
Comparison of methods for the characterisation by image analysis of crystalline agglomerates: The case of gibbsite
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结晶团聚体图像分析表征方法的比较：以三水铝矿为例
DOI：
10.1016/j.powtec.2005.05.011
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发表时间：
2005
影响因子：
5.2
通讯作者：
D. Audet
中科院分区：
文献类型：
--
作者：
M. Pons;V. Plagnieux;H. Vivier;D. Audet
四种成像技术（光学显微镜技术（P-OM）、将二次电子探测器应用于粉末的扫描电子显微镜（P-SE-SEM）、将背散射电子探测器应用于嵌入树脂中的粉末抛光部分的扫描电子显微镜，无需化学蚀刻（S-BS-SEM）和将二次电子探测器应用于嵌入树脂中的粉末抛光部分的扫描电子显微镜，进行化学蚀刻（S-SE-SEM））已应用于结晶团聚体（三水铝矿），以说明基于图像分析程序的结构表征和比较的可能性。如果P-OM可以很容易地应用于工业中，一旦选择了合适的浸没液体，从P-SE-SEM收集的外部结构信息将更加详细。 S-BS-SEM 能够可视化更大的颗粒组，但应接受由于切片而产生的偏差。与颗粒形状有关。 S-SE-SEM 与 S-BS-SEM 一样提供外部结构信息，此外还提供内部结构信息，但输出低于 S-BS-SEM。
Four imaging techniques (light microscopy technique (P-OM), scanning electron microscopy with a secondary electron detector applied to powders (P-SE-SEM), scanning electron microscopy with a backscattered electron detector applied to polished sections of powders embedded in a resin, without chemical etching (S-BS-SEM) and scanning electron microscopy with a secondary electron detector applied to polished sections of powders embedded in a resin, with chemical etching (S-SE-SEM)) have been applied to crystalline agglomerates (gibbsite) to illustrate the possibilities of structural characterisation and comparison based on image analysis procedures. If P-OM can be easily applied in industry, once a suitable immersion liquid has been selected, the information collected from P-SE-SEM on the external structure is more detailed. S-BS-SEM enables the visualisation of larger sets of particles but bias, due to sectioning, should be accepted. It is related to the shape of particles. S-SE-SEM provides information on the external structure as S-BS-SEM and, in addition, on the internal structure, but with a lower output than S-BS-SEM.