Damage studies on tungsten due to helium ion irradiation
Damage studies on tungsten due to helium ion irradiation
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DOI：
10.1016/j.jnucmat.2014.04.032
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发表时间：
2014-09
影响因子：
3.1
通讯作者：
N. Dutta;N. Buzarbaruah;S. Mohanty
中科院分区：
文献类型：
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作者：
N. Dutta;N. Buzarbaruah;S. Mohanty
利用等离子体聚焦装置发射的高能高注量氦离子，成功地研究了钨的辐照损伤。通过光学显微镜、场发射扫描电子显微镜、X射线衍射和硬度计对参考样品和辐照样品进行了表征。在较低放大倍数下的辐照样品的显微照片显示微米宽度的裂纹的均匀网格。然而，在更高的放大倍数下，可以清楚地观察到各种类型的晶体缺陷，如空隙、针孔、气泡、水泡和微裂纹。辐照样品的X射线衍射谱中的突出峰被视为向更高的布拉格角移动，从而指示由于氦离子传递的热负荷而导致的压缩应力的积累。还注意到辐照样品的硬度的边际降低。
Energetic and high fluence helium ions emitted in a plasma focus device have been used successfully to study the radiation induced damage on tungsten. The reference and irradiated samples were characterized by optical microscopy, field emission scanning electron microscopy, X-ray diffraction and by hardness testers. The micrographs of the irradiated samples at lower magnification show uniform mesh of cracks of micrometer width. However at higher magnification, various types of crystalline defects such as voids, pinholes, bubbles, blisters and microcracks are distinctly noticed. The prominent peaks in X-ray diffraction spectrum of irradiated samples are seen shifted toward higher Bragg angles, thus indicating accumulation of compressive stress due to the heat load delivered by helium ions. A marginal reduction in hardness of the irradiated sample is also noticed.