Reliable computation with unreliable computers

Reliable computation with unreliable computers
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使用不可靠的计算机进行可靠的计算

DOI:
10.1049/iet-cdt.2014.0110
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发表时间:
2015
影响因子:
1.2
通讯作者:
Brown A
Brown A
中科院分区:
计算机科学4区
文献类型:
--
作者:
Brown A

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随着计算系统不断向百万核架构发展,两个过去不重要的考虑因素变得越来越占主导地位:功耗(无论是FLOPS/W还是W/mm 2)和可靠性。本研究关注的是后者:在一个拥有100万个内核的系统中,期望上电时100%的功能是不现实的;同样,操作可用性会随着时间的推移而下降。使用传统技术监测和维护这样的系统的健康是昂贵的,并且大多数依赖于某种中央监督员或监测器的概念来对系统可用性做出最终判断,从而给出单点故障。未来的大型系统将由硬件和软件组成,这些硬件和软件协同工作以科普孤立的故障点,允许系统的总体行为在面对故障时以有意义的方式优雅地降级。这项研究描述了这样一个系统:尖峰神经网络架构是一个百万核机器,在许多级别上内置分层容错。作者展示了如何系统可用于解决典型的分布式热扩散方程,以及如何调制的质量的解决方案的影响,部分系统故障。
As computing systems continue their unquenchable rise towards and through million core architectures, two considerations that used to be unimportant become more and more dominant: power consumption (be it FLOPS/W or W/mm2) and reliability. This study is concerned with the latter: in a system of a million cores, it is unrealistic to expect 100% functionality on power‐up; equally, operational availability degrades with time. Monitoring and maintaining the health of such a system using traditional techniques is costly, and most rely on the concept of some sort of central overseer or monitor to make a final judgement about system availability, giving a single point of failure. Large systems of the future will consist of hardware and software that work synergistically to cope with isolated points of failure, allowing the gross behaviour of the system to degrade gracefully and in a meaningful way in the face of faults. This study describes one such system: spiking neural network architecture is a million‐core machine with layered fault‐tolerance built in at many levels. The authors show how the system may be used to solve the canonical distributed heat diffusion equation, and how the quality of solution is modulated by the effects of partial system failure.
DOI: 10.1109/superc.1995.32
发表时间: 1995-12
期刊: Proceedings of the IEEE/ACM SC95 Conference
影响因子: --
作者:
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通讯作者: S. Pakin;Mario Lauria;A. Chien
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DOI: --
发表时间: 1996
期刊: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
影响因子: --
作者:
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通讯作者: Jaidip Singh