Probe-rotating atomic force microscopy for determining material properties.
Probe-rotating atomic force microscopy for determining material properties.
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DOI：
10.1063/1.4869474
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发表时间：
2014-03
期刊：
影响因子：
--
通讯作者：
Sang Heon Lee
中科院分区：
文献类型：
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作者：
Sang Heon Lee
在本文中，我们提出了一种探针旋转原子力显微镜，可以在接触成像模式下进行任意方向的扫描，这是传统原子力显微镜由于探针的取向依赖和无法旋转探针头而难以实现的。为了使探头绕其垂直轴旋转，我们采用了紧凑轻便的探头，探头的传感器由光盘驱动器拾取单元制成。我们提出的机械结构、工作原理和控制系统可以实现不同方向的轴向和横向扫描。
In this paper, we propose a probe-rotating atomic force microscope that enables scan in an arbitrary direction in the contact imaging mode, which is difficult to achieve using a conventional atomic force microscope owing to the orientation-dependent probe and the inability to rotate the probe head. To enable rotation of the probe about its vertical axis, we employed a compact and light probe head, the sensor of which is made of an optical disk drive pickup unit. Our proposed mechanical configuration, operating principle, and control system enables axial and lateral scan in various directions.