Characterization of microchannel plates for plasma x‐ray diagnostics in the 0.6–82‐keV energy region
Characterization of microchannel plates for plasma x‐ray diagnostics in the 0.6–82‐keV energy region
复制标题
0.6-82-keV 能量区域等离子体 X 射线诊断微通道板的表征
DOI：
10.1063/1.1140748
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发表时间：
1989
影响因子：
1.6
通讯作者：
Y. Satow
中科院分区：
文献类型：
--
作者：
N. Yamaguchi;T. Cho;T. Kondoh;M. Hirata;S. Miyoshi;S. Aoki;H. Maezawa;M. Nomura;Y. Satow
用同步辐射测量了微通道板(MCP)X射线探测器在0.6-82keV的宽能量范围内的电流响应特性。在具有连续光子能量的电流响应曲线中，观察到与MCP玻璃和电极材料(Si、Pb、Ba和Fe)的组成元素的吸收边相对应的一些不连续。文中还研究了微通道响应与X射线入射到通道轴的角度θ的关系。这些特性不同于COT θ对软X射线的依赖(hν60keV)。这些结果可以为使用MCP的X射线诊断仪的设计提供指导。
Current response characteristics of microchannel plates (MCPs) x‐ray detectors have been measured in a wide energy range from 0.6 to 82 keV using synchrotron radiation. In the current response curve with continuous photon energy, some discontinuities have been observed to correspond to absorption edges of elements which are the constituents of MCP glass and electrode materials (Si, Pb, Ba, and Fe). The dependence of the MCP response on the incident angle of x rays to the channel axis, θ, is also investigated. The characteristics change from the cot θ dependence for soft x rays (hν 60 keV). These results could provide guidelines on the design of x‐ray diagnostic instruments using MCPs.